# Test reports

| FA | Test Case | Qualcomm Dragonwing™ RB3 Gen 2 Vision Kit | Qualcomm Dragonwing™ RB3 Gen 2 Industrial Development Kit | Qualcomm Dragonwing™ Beta IQ-9075 Evaluation Kit | Qualcomm Dragonwing™ IQ-9075 Evaluation Kit | Qualcomm Dragonwing™ IQ-8275 Evaluation Kit |
| --- | --- | --- | --- | --- | --- | --- |
| <br>Kernel | Access Serial Console | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | adb shell reboot | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | Reboot edl | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | Reboot (shutdown -r) | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | Reboot (shutdown -r now) | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | Force shutdown(shutdown -h now) | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | shutdown (simple shutdown) | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | CPU utilization in idle state | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | ZRAM | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | Dump collection | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | Boot to adb shell | Pass | Pass | Pass | Pass | Pass |
| <br>Kernel | Pil | Pass | Pass | Pass | Pass | Pass |
| <br>LE Core | Check udev is running | Pass | Pass | Pass | Pass | Pass |
| <br>LE Core | systemctl enable or disable unit | Pass | Pass | Pass | Pass | Pass |
| <br>LE Core | systemd Initialization | Pass | Pass | Pass | Pass | Pass |
| <br>LE Core | PD mapper service check | Pass | Pass | Pass | Pass | Pass |
| <br>LE Core | services start/stop | Pass | Pass | Pass | Pass | Pass |
| Tools | QIFL flashing | Pass | Pass | Pass | Pass | Pass |
| Security | SELinux\_Permissive\_Check | Pass | Pass | Pass | Pass | Pass |
| <br>Power | Suspend | Pass | Fail | NA | Pass | Pass |
| <br>Power | TCXO | Pass | Fail | NA | NA | NA |
| Boot | KVM | Pass | Pass | Pass | Pass | Pass |
| Connectivity | BT enable | Pass | Pass | Pass | Pass | Pass |
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Last Published: Apr 02, 2026

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Source: [https://docs.qualcomm.com/doc/80-70029-300/topic/test_reports.html](https://docs.qualcomm.com/doc/80-70029-300/topic/test_reports.html)