# Samples and known issues Source: [https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html) This topic discusses the issues, regardless of the sample type (or types) on which they occur. ## Sample testing Source: [https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html) For device identification details, see [Table : Device identification details](https://docs.qualcomm.com/doc/80-23889-1/topic/mechanical-information.html#gsh1612798352300__table_hwg_5vl_bkb). ### Engineering samples (ES) Source: [https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html) These devices undergo limited testing and sometimes have significant feature limitations. They are suitable to assist with PCB development to conduct board-level electrical evaluation tests, and to explore manufacturing considerations. Do not use engineering samples for product-level qualification. ### Commercial samples (CS) Source: [https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html) These devices undergo full production-level testing, and meet the specifications and features described in the data sheet, except as otherwise noted in this document. They have passed device level qualification. Commercial samples are suitable for performance testing, and also for product level production and qualification. ## Known issues Source: [https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-23889-1/topic/samples-and-known-issues.html) There are no known issues in the QCS6490 and QCS5430 chipsets. Last Published: Sep 23, 2025 [Previous Topic Part reliability](https://docs.qualcomm.com/bundle/publicresource/80-23889-1/topics/part-reliability.md) [Next Topic Revision history](https://docs.qualcomm.com/bundle/publicresource/80-23889-1/topics/Revision_history.md)