# Samples and known issues
Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html)
## Sample testing
Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html)
### Engineering samples (ES)
Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html)
These devices undergo limited testing and sometimes have significant feature limitations.
They are suitable to assist with PCB development, to conduct board-level electrical
evaluation tests, and to explore manufacturing considerations. Engineering samples
should not be used for product-level qualification.
### Commercial samples (CS)
Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html)
These devices undergo full production-level testing, and meet the specifications and
features described in the device specification, except as otherwise noted in this
document. They have passed device-level qualification. Commercial samples are suitable
for performance testing, and also for product-level production and qualification.
## Known issues
Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html)
### Summary of known issues
Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html)
All known issues for each revision of the QCC743/QCC744 device are summarized
in [Table : Known issues – all sample types and revisions](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html#summary-of-known-issues__table_rbx_gq1_p1c). The text within the Issue column provides links
to the sections of this document that explain the issues, regardless of the sample type
(or types) on which they occur. An X in one or more of the sample type columns indicates
that the issue occurs in the corresponding sample type.
The following information is provided for each issue:
- Issue description
- Impact to system performance
- Possible workarounds to minimize impact
Table : Known issues – all sample types and revisions
| Issue # | Issue description | Workaround | QCC743-1 CS (PRR=100, 101)
QCC744-2 CS (PRR=200, 201) |
| --- | --- | --- | :---: |
| Issue 1 | DMA accesses to the XIP address space across a 32‑byte boundary
result in a read data error. | Software workaround | X |
| Issue 2 | E907 hangs if prefetch data from an uninitialized PSRAM | Default software | X |
### Issues – description, impact, and workaround
Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html)
### Issue 1
| Description | DMA accesses to the XIP address space across a 32‑byte boundary
result in a read data error. |
| --- | --- |
| Impact | Result data error |
| Workaround | Software workaround: