# Samples and known issues Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html) ## Sample testing Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html) ### Engineering samples (ES) Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html) These devices undergo limited testing and sometimes have significant feature limitations. They are suitable to assist with PCB development, to conduct board-level electrical evaluation tests, and to explore manufacturing considerations. Engineering samples should not be used for product-level qualification. ### Commercial samples (CS) Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html) These devices undergo full production-level testing, and meet the specifications and features described in the device specification, except as otherwise noted in this document. They have passed device-level qualification. Commercial samples are suitable for performance testing, and also for product-level production and qualification. ## Known issues Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html) ### Summary of known issues Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html) All known issues for each revision of the QCC743/QCC744 device are summarized in [Table : Known issues – all sample types and revisions](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html#summary-of-known-issues__table_rbx_gq1_p1c). The text within the Issue column provides links to the sections of this document that explain the issues, regardless of the sample type (or types) on which they occur. An X in one or more of the sample type columns indicates that the issue occurs in the corresponding sample type. The following information is provided for each issue: - Issue description - Impact to system performance - Possible workarounds to minimize impact Table : Known issues – all sample types and revisions | Issue # | Issue description | Workaround | QCC743-1 CS (PRR=100, 101)

QCC744-2 CS (PRR=200, 201) | | --- | --- | --- | :---: | | Issue 1 | DMA accesses to the XIP address space across a 32‑byte boundary
result in a read data error. | Software workaround | X | | Issue 2 | E907 hangs if prefetch data from an uninitialized PSRAM | Default software | X | ### Issues – description, impact, and workaround Source: [https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html](https://docs.qualcomm.com/doc/80-WL743-1/topic/samples-and-known-issues.html) ### Issue 1 | Description | DMA accesses to the XIP address space across a 32‑byte boundary
result in a read data error. | | --- | --- | | Impact | Result data error | | Workaround | Software workaround:
| ### Issue 2 | Description | E907 hangs if prefetch data from an uninitialized pSRAM | | --- | --- | | Impact | System hang | | Workaround | Default software:
| Last Published: Apr 22, 2026 [Previous Topic Part reliability](https://docs.qualcomm.com/bundle/publicresource/80-WL743-1/topics/part-reliability.md)